Sitemap RSS

Partnership Agreement with ASTER Technologies Signed

Partnership Agreement with ASTER Technologies Signed

Testonica Lab has signed a distribution agreement with France/Rennes based company ASTER Technologies. In frames of this agreement Testonica will distribute ASTER products: TestWay, TestWay Express, QuadView, QUAD, TPQR, and WildScan on the territory of Baltic states.

TestWay is a proven solution, used by many PCB design and manufacturers worldwide that provides a unique approach to analyze electrical testability requirements and estimate test coverage aligned to specific test strategies, at the earliest opportunity in the design cycle. The TestWay open architecture design is based on a testability framework that interfaces with a variety of plug-in modules to provide both import and export opportunities that make it fully customizable to customer's specific requirements.

TPQR is a “low-cost” and “easy-to-use” software tool for PCB analysis. Based on the leading TestWay’s core, it makes it possible to quantify and qualify the test coverage for many inspection and test equipments.

QuadView is a powerful set of scalable board viewing modules that can be used either as a standalone viewer or fully integrated within customer's applications. QuadView can be used in the design environment to assist in DfT and test coverage analysis. Whereas, within the manufacturing environment it becomes an integral part of the repair cycle, assisting in locating faults and reducing repair time significantly.

QUAD is a flexible modular Quality Management tool built around a centralized and open architecture database, providing traceability for any PCB electronic production data. QUAD covers all quality aspects of PCB assembly, sub-assembly and system build, allowing you to manage the quality data flow from product realization to product retirement. It has been designed to be used either standalone or to be easily integrated into any existing production environment.

WildScan is a product that makes it possible to migrate a Boundary-Scan test (BST) program to an In-Circuit tester (ICT) without the need for any complementary hardware integration within the In-Circuit tester. This significantly reduces test fixturing costs by utilising the same test fixture for both Boundary-Scan and In-Circuit testing, providing a one-stop test solution.